Erin Holley is a Senior Member of Technical Staff at Introspect Technology, a leading manufacturer of innovative test and measurement products for high speed digital applications. A graduate of McGill University in Montreal, Canada, Erin currently leads the development of Introspect’s memory interface test solutions, and she is responsible for delivering and sustaining highly-parallel test instruments that operate at data rates of up to 32 Gbps. Erin is a member of the JEDEC Association, the MIPI Alliance, and PCI-SIG, and she regularly represents Introspect Technology at industry events. Her main interests are in high-speed digital design and test system architecture. She works with vendors at all stages of DDR memory design, translating difficult industry challenges into extremely compelling design validation tools for engineers.
