Many aspects of printed circuit board layout and design for signal integrity require measurement verification, for example, connector interfaces, via transitions, and material characterization. However, the location, or port, at which S-parameters are desired are typically at some interior point on the PCB design, and removed from the measurement port where cables or probes are located. Consequently, this test fixturing must be de-embedded before using the measured S-parameters for comparison with simulation, in channel analysis, or for material extraction. De-embedding using a 2X Thru approach will presented, and suitable test fixture development for successful de-embedding to high frequencies will be discussed. The specific application presented will be PCB material characterization.