SI/PI Sponsored By Introspect Technology Workshop

System Oriented Testing for Memory Interfaces


Eastern Time October 20, 2020 1:30 pm - 2:00 pm

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Erin Holley

Next-generation data center and server architectures rely heavily on high-speed signaling interfaces. No longer restricted to the networking sub-systems of the data center, these high-speed interfaces are used to connect processors, AI hardware accelerators, switching and routing fabrics, and of course extremely high-density memory channels. Testing these highly parallel signaling interfaces represents a particular challenge due to the tight interaction between environmental parameters, physical layer effects, and protocol payloads. Memory test solutions in particular must be capable of adapting to protocol changes and in-depth compliance measurements, as well as providing a means to perform system-level functional validation. This workshop will include an overview and demo of Introspect’s highly parallel memory interface test solution, showing the role it plays in ensuring the proper characterization and screening of DIMMs and components for the DDR5, and similar, memory standards.