5G/IoT/Automotive Sponsored By AR RF/Microwave Instrumentation Workshop

Getting to the Source: Integrated Circuits (ICs) and Component EMC Testing


Eastern Time October 6, 2020 3:00 pm - 3:30 pm

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Dean F. Landers

Failures in EMC testing often result in treating the symptoms of the issue rather than attacking the source. If we know the source of the issue rather than chase the symptoms, we will save time, cost, and frustrations. In this discussion, we will attack EMC testing from a component standpoint so that when issues arise, we can pinpoint the solution, saving time, cost, and frustrations.