SI/PI Sponsored by Rohde & Schwarz Workshop

Get to Your ‘AHA’ Moment Quicker With Advanced Eye Analysis


Eastern Time October 5, 2022 2:00 pm - 2:30 pm

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Jithu Abraham

Many high-speed digital standards utilise eye analysis on their data stream for verifying signal integrity. This allows engineers to quickly check noise margins and the overall health of their transmitted or received bits. However, most often this implies capturing lots of UIs of the signal and folding each bit to display an eye, which involves a fair amount of post-processing to realise. R&S have developed a novel way of capturing and measuring eye diagrams in hardware. Making it much faster to capture, lock on and display all the bits required for finding anomalies or statistical analysis. The investigative mask test features allow to spot failures very quickly. Join us to learn more on how to set this up and gain insights to your designs quicker.